Because the success of a MEMS product typically depends on low-cost and high-yield production, it is crucial to ensure
- Run-to-run process repeatability
- Wafer-to-wafer process repeatability
- Across wafer process uniformity
Our extensive experience in the production of probes for Scanning Probe Microscopy and a close collaboration with the Fraunhofer Institute of Integrated Systems and Device Technology enables us to create a production environment focused directly on these elements. This will be ensured by the access to the full capacity of many facilities for 100mm and 150mm wafer fabrication which has been completed by our own equipment.